The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2005

Filed:

Apr. 14, 2000
Applicants:

Rene Morales, Jr., Austin, TX (US);

Charles Vaughn Rankin, Austin, TX (US);

Inventors:

Rene Morales, Jr., Austin, TX (US);

Charles Vaughn Rankin, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F009/44 ;
U.S. Cl.
CPC ...
Abstract

A data processing system, method, and program including an automated software test environment are disclosed for automatically testing a software application. A work flow manager is established for automatically managing the automated software test environment. The automated software test environment includes multiple computer systems coupled to a server computer system utilizing a network. The work flow manager is executed utilizing the server computer system. Multiple ordered test phases are established. At least each of two of the order test phases are executed utilizing different ones of the computer systems. An event is transmitted to the work flow manager utilizing one of the computer systems to start execution of selected ones of the ordered test phases. The work flow manager controls execution of the selected ordered test phases in response to the receipt of events.


Find Patent Forward Citations

Morales, Jr., Rene. (2005). Data processing system, method, and program for automatically testing software applications (U.S. Patent No. 6959433). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6959433

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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