The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2005
Filed:
Dec. 13, 2001
Laurent A. Six, Le Bar sur Loup, FR;
Laurent A. Six, Le Bar sur Loup, FR;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method for providing context save and restore using a test scan chain is provided. The method includes dividing a scan chain () of digital logic components () into a plurality of sub-chains (). A first data set is provided in the sub-chains (). The sub-chains () are linked in parallel and to a hardware resource for executing an application. The sub-chains () are linked to a device memory (). A first application is executed to update the first data set in the sub-chains (). The first application is operable to use the hardware resource. The updated first data set is stored in the device memory (). A second data set is restored from the device memory () to the sub-chains (). A second application is executed to update the second data set in the sub-chains (). The second application is operable to use the hardware resource.