The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2005
Filed:
Aug. 13, 2004
Weiguang Zhu, Singapore, SG;
Zhihong Wang, Singapore, SG;
Chen Chao, Singapore, SG;
Ooi Kiang Tan, Singapore, SG;
Weiguang Zhu, Singapore, SG;
Zhihong Wang, Singapore, SG;
Chen Chao, Singapore, SG;
Ooi Kiang Tan, Singapore, SG;
Nanyang Technological University, Singapore, SG;
Abstract
An interferometer has a source for generating a first beam and a second beam of a coherent monochromatic light having a wavelength λ, optical elements for directing the beams through two different optical paths having a path-length difference, a detector for detection of an interference signal of the beams, and a modulator for additionally varying the path-length difference periodically to allow the interference signal be detected near a path-length difference of λ/4 periodically. A maximum intensity change in the interference signal caused by a small period change of the path-length difference is thus detectable. The maximum intensity change caused by varying the path-length difference by at least λ/2 may also be detectable. The interferometer may be used to measure small vibrations, without pre-calibration and/or a feedback servo system for keeping the path-length difference near λ/4.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile