The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2005
Filed:
Mar. 18, 2003
Frederic Bevilacqua, Costa Mesa, CA (US);
David Cuccia, Irvine, CA (US);
Anthony J. Durkin, Costa Mesa, CA (US);
Bruce J. Tromberg, Irvine, CA (US);
Frederic Bevilacqua, Costa Mesa, CA (US);
David Cuccia, Irvine, CA (US);
Anthony J. Durkin, Costa Mesa, CA (US);
Bruce J. Tromberg, Irvine, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Illumination with a pattern of light allows for subsurface imaging of a turbid medium or tissue, and for the determination of the optical properties over a large area. Both the average and the spatial variation of the optical properties can be noninvasively determined. Contact with the sample or scanning is not required but may be desired. Subsurface imaging is performed by filtering the spectrum of the illumination in the Fourier domain but other filtering approaches, such as wavelet transform, principle component filter, etc may be viable as well. The depth sensitivity is optimized by changing the spatial frequency of illumination. A quantitative analysis of the average optical properties and the spatial variation of the optical properties is obtained. The optical properties, i.e. reduced scattering and absorption coefficients are determined from the modulated transfer function, MTF.