The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2005

Filed:

Sep. 30, 2003
Applicants:

Georg Braun, Holzkirchen, DE;

Hermann Ruckerbauer, Moos, DE;

Simon Muff, Höhenkirchen, DE;

Inventors:

Georg Braun, Holzkirchen, DE;

Hermann Ruckerbauer, Moos, DE;

Simon Muff, Höhenkirchen, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R035/00 ;
U.S. Cl.
CPC ...
Abstract

Interface parameters for a plurality of semiconductor devices, particularly parameters for output drivers (i.e. on chip driver) and terminations (i.e. on die termination) for double data rate dynamic random access memories, are aligned using a calibration reference which is common to the semiconductor devices and is connected to calibration connections on the semiconductor devices. The semiconductor devices are calibrated in succession, in each case individually, and the calibration connection on the respective semiconductor device which is currently performing calibration is connected to an internal calibration unit by an internal switching unit in the process, and the calibration connections on all other semiconductor devices are terminated to a high impedance internally.


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