The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2005

Filed:

Apr. 14, 2004
Applicants:

John F. Burd, San Diego, CA (US);

Gary Krantz, Laguna Beach, CA (US);

William Sell, Petaluma, CA (US);

Inventors:

John F. Burd, San Diego, CA (US);

Gary Krantz, Laguna Beach, CA (US);

William Sell, Petaluma, CA (US);

Assignee:

Oculir, Inc., San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B005/00 ;
U.S. Cl.
CPC ...
Abstract

The present invention is related to optical non-invasive methods and instruments to detect the level of analyte concentrations in the tissue of a subject. The spectra of mid-infrared radiation emitted from a subject's body are altered corresponding to the concentration of various compounds within the radiating tissue. In one aspect of the invention, an instrument measures the level of mid-infrared radiation from the subject's body surface, such as the eye, and determines a specific analyte's concentration based on said analyte's distinctive mid-infrared radiation signature.


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