The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2005
Filed:
Oct. 30, 2003
Masahiro Tooma, Kanasago, JP;
Naoyuki Kono, Mito, JP;
Masahiro Koike, Hitachi, JP;
Hirokazu Adachi, San Francisco, CA (US);
Takao Shimura, Hitachi, JP;
Makoto Senoo, Tokai, JP;
Tetsuya Matsui, Hitachi, JP;
Masahiro Tooma, Kanasago, JP;
Naoyuki Kono, Mito, JP;
Masahiro Koike, Hitachi, JP;
Hirokazu Adachi, San Francisco, CA (US);
Takao Shimura, Hitachi, JP;
Makoto Senoo, Tokai, JP;
Tetsuya Matsui, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An ultrasonic inspection instrument for detecting a crack and performing sizing in the depth direction of the crack. By a transmitter element array and a receiver element array included in a common sensor, focus points between focused acoustic fields are electronically scanned in a range including a location where half the sum of the transmitting angle of ultrasonic waves to an inspection-target material and the receiving angle of diffraction echoes from the inspection-target material is 30 degrees, so that a tip portion of the crack is detected from the received diffraction echoes. Thus, the detectability of the ultrasonic inspection instrument for detecting diffraction waves in a subject to be inspected and performing crack inspection is stabilized and kept high.