The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2005

Filed:

Jul. 11, 2003
Applicants:

Neal G. Skinner, Lewisville, TX (US);

John R. Dennis, Bozeman, MT (US);

Michel Leblanc, Plano, TX (US);

Gregg Johnson, Fairfax, VA (US);

Michael D. Todd, Alexandria, VA (US);

Inventors:

Neal G. Skinner, Lewisville, TX (US);

John R. Dennis, Bozeman, MT (US);

Michel Leblanc, Plano, TX (US);

Gregg Johnson, Fairfax, VA (US);

Michael D. Todd, Alexandria, VA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B047/06 ;
U.S. Cl.
CPC ...
Abstract

A well pressure and temperature measurement system and method are provided. In a described embodiment, a sensor system includes multiple strain sensors attached to a structure which changes dimensionally in response to well pressure and temperature changes. The strain sensors may be fiber optic sensors. The structure may be tubular and the strain sensors may detect axial and hoop strains in the structure.


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