The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2005
Filed:
Jun. 27, 2002
Tom Mckeone, Austin, TX (US);
Bruce A. Loyer, Austin, TX (US);
Tom McKeone, Austin, TX (US);
Bruce A. Loyer, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method for including probe locations in an integrated circuit may include specifying probe cells prior to the place and route stage of the design process. The probe cell locations may be specified in a functional description of the integrated circuit, such as an HDL description from which a netlist may be generated. Alternatively, an existing netlist may be edited to include the probe cells on specified nets. The probe locations are included in the physical layout design along with the rest of the integrated circuit components during place and route. The integrated circuit may be fabricated according to the physical layout design so that the fabricated integrated circuit includes the one or more probe locations.