The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2005

Filed:

Dec. 20, 2002
Applicants:

Danny Geist, Haifa, IL;

Anna Gringauze, Haifa, IL;

Sharon Keidar, Yokneam, IL;

Inventors:

Danny Geist, Haifa, IL;

Anna Gringauze, Haifa, IL;

Sharon Keidar, Yokneam, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

A method for verifying a property of a complete model of a system under study includes abstracting at least some of the variables from the model so as to produce an abstract model of the system. Beginning with an initial state in a state space of the abstract model, an abstract path is found through the state space of the abstract model in accordance with the transition relation to a target state defined by the property. A subset of the abstracted variables is restored to the abstract model so as to produce an intermediate model of the system, and the property on the complete model is verified based on the intermediate model.


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Geist, Danny. (2005). Model checking with layered localization reduction (U.S. Patent No. 6957404). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6957404

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