The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2005

Filed:

Oct. 31, 2000
Applicants:

Michael L. Boucher, Lafayette, CO (US);

Shaun M. Dennie, Lafayette, CO (US);

Paul J. Hinker, Longmont, CO (US);

Inventors:

Michael L. Boucher, Lafayette, CO (US);

Shaun M. Dennie, Lafayette, CO (US);

Paul J. Hinker, Longmont, CO (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N007/00 ; G06N007/08 ;
U.S. Cl.
CPC ...
Abstract

Methods and systems consistent with this invention analyze the performance of a program executed in a data processing system. Such methods and systems assign a semantic to the performance of the program, and measure the level of performance of the program based on the semantic. As part of assigning a semantic, such methods and systems indicate a class of processing of which to measure performance, and may define a suctitude associated with the class. Such methods and systems define the class as a processing function that could contribute to the poor performance of the program. As part of measuring the level of performance, such methods and systems measure the suctitude of the indicated class during program execution.


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