The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2005

Filed:

Jun. 27, 2000
Applicants:

Lawrence Kwong Lam, San Jose, CA (US);

Timothy Edwin Van Eck, Los Altos, CA (US);

Inventors:

Lawrence Kwong Lam, San Jose, CA (US);

Timothy Edwin Van Eck, Los Altos, CA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B009/02 ;
U.S. Cl.
CPC ...
Abstract

A dual electrooptic interferometer and method for operation thereof. In a preferred embodiment, the interferometer includes first and second electro-optically active optical waveguides; a first electrode substantially parallel to the first waveguide in a traveling wave modulator configuration; a second electrode substantially parallel to the second waveguide in a traveling wave modulator configuration; and a photo detector array optically coupled to the outputs of the waveguides.


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Lam, Lawrence. (2005). Dual electrooptic waveguide interferometer (U.S. Patent No. 6956653). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6956653

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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