The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2005
Filed:
Jan. 10, 2002
David A. Boas, New Market, NH (US);
Joe Culver, Salem, MA (US);
Simon Arridge, London, GB;
Thomas Gaudette, Jamaica Plain, MA (US);
David A. Boas, New Market, NH (US);
Joe Culver, Salem, MA (US);
Simon Arridge, London, GB;
Thomas Gaudette, Jamaica Plain, MA (US);
General Hospital Corporation, Boston, MA (US);
Abstract
The methods and systems are provided that alleviate the impact of experimental systematic errors. These calibration methods and systems can be based on the discovery that by including source and detector calibration factors as part of the inverse calculation for image reconstruction, image artifacts can be significantly reduced. The novel methods and systems enhance contrast in images of the distribution of the radioactive properties of a medium, and enable improved detection of, for example, spatial variations in optical properties within highly scattering media, such as human or animal tissue. The novel methods and systems receive radiation which exits from the medium. Then, one or more optical properties of the medium are derived using the received radiation and one or more calibration factors, wherein the calibration factors are variables. Subsequently, a distribution of the optical properties in the medium is determined using the derived optical properties.