The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2005
Filed:
Dec. 20, 2004
Thomas H. Foster, Rochester, NY (US);
David L. Conover, Rochester, NY (US);
Chad E. Biglow, Rochester, NY (US);
Irene Georgakoudi, Action, MA (US);
Andrey Mezhiba, Rochester, NY (US);
Soumya Mitra, Rochester, NY (US);
Thomas H. Foster, Rochester, NY (US);
David L. Conover, Rochester, NY (US);
Chad E. Biglow, Rochester, NY (US);
Irene Georgakoudi, Action, MA (US);
Andrey Mezhiba, Rochester, NY (US);
Soumya Mitra, Rochester, NY (US);
University of Rochester, Rochester, NY (US);
Abstract
A method for operating a confocal microscope system includes deflecting a light beam on a specimen with at least one beam deflection device. The position of the light beam is stepped with at least one beam deflection device across the specimen. A sample of emitted fluorescent light from the specimen is captured in synchronization with each of the stepped positions of the light beam. An image is obtained from the captured samples of emitted fluorescent light.