The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2005
Filed:
Dec. 20, 2002
Georg Wittman, Herzogenaurach, DE;
Joerg Blaessing, Oberkochen, DE;
Matthias Stoessel, Mannheim, DE;
Jan Birnstock, Leipzig, DE;
Karsten Heuser, Erlangen, DE;
Georg Wittman, Herzogenaurach, DE;
Joerg Blaessing, Oberkochen, DE;
Matthias Stoessel, Mannheim, DE;
Jan Birnstock, Leipzig, DE;
Karsten Heuser, Erlangen, DE;
Osram Opto Semiconductors GmbH, Regensburg, DE;
Abstract
Apparatus and procedure for the in situ measurement of quantities of polymer printed onto supports A source of radiationsends electromagnetic radiation onto a dropletof polymer solution or polymer dispersion, which is printed onto a support. A detectormeasures the transmitted or re-emitted radiation. Controlled by a comparator deviceand a control unit, the printing parameters are corrected in situ, if necessary. In this manner, a controlled adjustment of the layer thickness of organic light-emitting diodes and therefore luminosity and color perception can be achieved.