The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2005
Filed:
May. 01, 2003
Jorge Eduardo Franke, Orefield, PA (US);
John Sargent French, Palm, PA (US);
Sheldon Louis Sun, Allentown, PA (US);
William Joseph Thompson, Kempton, PA (US);
Jorge Eduardo Franke, Orefield, PA (US);
John Sargent French, Palm, PA (US);
Sheldon Louis Sun, Allentown, PA (US);
William Joseph Thompson, Kempton, PA (US);
Other;
Abstract
A device and method that performs error analysis of an optical component. An optical transmitter transmits a test signal at a plurality of selected optical power levels. A port outputs the test signal to the optical component, and then receives a version of the test signal from the optical component. A receiver determines errors in the received version of the test signal. A processor determines an error rate at each of the selected optical power levels based on the determined errors, and also determines an uncertainty range for each determined error rate. An interface provides indication of the determined error rates in relation to the determined uncertainty ranges.