The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2005

Filed:

Aug. 25, 2004
Applicants:

Makoto Horiuchi, Koganei, JP;

Mamoru Umeki, Hachioji, JP;

Akira Taguchi, Hachioji, JP;

Youichi Ono, Akiruno, JP;

Inventors:

Makoto Horiuchi, Koganei, JP;

Mamoru Umeki, Hachioji, JP;

Akira Taguchi, Hachioji, JP;

Youichi Ono, Akiruno, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B027/32 ; G03B027/72 ; B41J002/47 ;
U.S. Cl.
CPC ...
Abstract

A density adjustment method for adjusting a density of a diagnostic image, having the steps of; exposing an image; developing the latent image; measuring a density of the developed image; creating a lookup table for relating the diagnostic image data and amount of exposure so as to form a density specified by the diagnostic image data; and correcting at least one of an exposure condition and a development condition to ensure that the next film has the optimized density, based on the difference between the measured density of a partial area of the film, and a density for comparison; wherein, a density of a prescribed area in a test exposure image is used as the density for comparison; while the exposure amount is used for exposing the partial area of the film at the time of forming a diagnostic image.


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