The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2005

Filed:

Oct. 03, 2002
Applicants:

Alan R. Bandy, Blue Bell, PA (US);

Robert Gordon Ridgeway, Quakertown, PA (US);

Glenn Michael Mitchell, Sellersville, PA (US);

Inventors:

Alan R. Bandy, Blue Bell, PA (US);

Robert Gordon Ridgeway, Quakertown, PA (US);

Glenn Michael Mitchell, Sellersville, PA (US);

Assignee:

Drexel University, Philadelphia, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D059/44 ; H01J049/00 ;
U.S. Cl.
CPC ...
Abstract

Negative ion atmospheric pressure ionization mass spectrometers and selected ion mass spectrometers with aNi ion source and a drift tube for reaction of a sample with electrons from theNi ion source prior to analysis of a sample by mass spectrometry are provided. Also provided are methods for chemically analyzing a sample by negative ion atmospheric pressure ionization mass spectrometry by exposing the sample to electrons from aNi ion source in a drift tube and allowing the sample and electrons to react in the drift tube prior to analysis via mass spectrometry.


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