The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2005
Filed:
Nov. 13, 2002
Joerg Sabczynski, Norderstedt, DE;
Waldemar Zylka, Herten, DE;
Joerg Sabczynski, Norderstedt, DE;
Waldemar Zylka, Herten, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A description is given of a method and a device for the calibration of an image pick-up device which is sensitive to magnetic fields and for the imaging by means of such an image pick-up device. The image pick-up device is notably an image intensifier in X-ray systems such as, for example, systems provided with a C-arm. Calibration is performed essentially by forming and storing a look-up table whereby a plurality of magnetic field data acting on the image pick-up device is associated with calibration data required for correcting the distortions caused thereby. During imaging, the magnetic field data acting on the image pick-up device during the formation of an image is measured and the calibration data associated with this magnetic field data in the table is read out and used for the correction of the acquired image.