The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2005
Filed:
Sep. 08, 2003
Applicants:
Dennis B. Neff, Grove, OK (US);
Edgar L. Butler, Buena Vista, CO (US);
William Allen Lucas, Houston, TX (US);
Inventors:
Dennis B. Neff, Grove, OK (US);
Edgar L. Butler, Buena Vista, CO (US);
William Allen Lucas, Houston, TX (US);
Assignee:
ConocoPhillips Company - I. P. Legal, Houston, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V001/28 ;
U.S. Cl.
CPC ...
Abstract
Waveform data, such as reflection seismic data, is filtered by concurrently analyzing various phase angles of the data. The various phase angles of the data are compared to phase rotated background trends and the phase angle producing the maximum deviation from the equivalent background trend is selected as the optimum phase angle for predictive analysis or exclusion filtering.