The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2005

Filed:

Dec. 18, 2003
Applicant:

Jong Hun Park, Gyeonggi-do, KR;

Inventor:

Jong Hun Park, Gyeonggi-do, KR;

Assignee:

Hynix Semiconductor Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C008/00 ;
U.S. Cl.
CPC ...
Abstract

A column repair circuit of a semiconductor memory device including a plurality of memory cell array blocks each having the different number of wordlines comprises a predecoder, a block selector, a unit selector and a fuse means. The predecoder decodes a row address. The block selector generates block selecting signals to select the memory cell array blocks. The unit selector generates unit selecting signals to select a size of a row corresponding to the selected memory cell array. The fuse means generates a column repair control signal activated when a column repair is performed on the selected memory cell array block. The column repair circuit performs a column repair operation by a memory cell array block unit, thereby improving column repair efficiency and reducing the number of column repair fuses.


Find Patent Forward Citations

Park, Jong. (2005). Column repair circuit (U.S. Patent No. 6954399). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6954399

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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