The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2005
Filed:
Feb. 27, 2003
Jong Yun Yun, Cupertino, CA (US);
Chin Won Cho, San Jose, CA (US);
HU Yul Bang, Santa Clara, CA (US);
Jae June Kim, Sunnyvale, CA (US);
Jong Yun Yun, Cupertino, CA (US);
Chin Won Cho, San Jose, CA (US);
Hu Yul Bang, Santa Clara, CA (US);
Jae June Kim, Sunnyvale, CA (US);
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
The invention provides a method insuring that each read channel optimization step is controllable in terms of quality divergence, that a systematic response can be made which can be readily automated. The method is applicable to a pre-existing read channel optimization (RCO) script. The method includes the following operations. Acquiring a first quality measure and a first parameter list. Performing the pre-existing RCO script creating a second quality measure and a second parameter list based upon the first parameter list. Convergence processing the first and second quality measures and parameter lists.