The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2005

Filed:

Sep. 25, 2003
Applicants:

Paul H. Holloway, Gainesville, FL (US);

Mark R. Davidson, Florahome, FL (US);

Olga Alexander Shenderova, Raleigh, NC (US);

Gary E. Mcguire, Carrboro, NC (US);

David B. Tanner, Gainesville, FL (US);

Arthur Hebard, Gainesville, FL (US);

Inventors:

Paul H. Holloway, Gainesville, FL (US);

Mark R. Davidson, Florahome, FL (US);

Olga Alexander Shenderova, Raleigh, NC (US);

Gary E. McGuire, Carrboro, NC (US);

David B. Tanner, Gainesville, FL (US);

Arthur Hebard, Gainesville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B027/10 ; G02B021/36 ; G02B013/16 ; H04N005/225 ;
U.S. Cl.
CPC ...
Abstract

An imaging device () can include a plurality of lenses () mounted on a multi-dimensional support structure (), a plurality of optical detectors () corresponding to the plurality of lenses for capturing an optical signal from at least two lenses among the plurality of lenses, and a processor () for combining the optical signal from at least two lenses to form an image and electronically controlling the field of view and a resolution of the image. The plurality of lenses each can include an array of sub-wavelength apertures or a plurality of photon sieve lenses ().


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