The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2005
Filed:
Aug. 28, 2003
Katsuhiko Ogiso, Tokyo, JP;
Katsuhiko Ogiso, Tokyo, JP;
Jaxel Corp., Tokyo, JP;
Abstract
A wall thickness of each layer or a size of a space between layers of a multilayer structured container can be easily measured with high accuracy. According to a method for measuring an inner size of a container by irradiating a multilayer structured containeras a target for measurement with X-rays radiated from an X-ray generating sourceand by detecting the X-rays transmitting the container by a detector, the X-ray generating source, a slit, and the detectorperform a linear scan to the containerin a direction orthogonal to beamsin addition to disposing the slit (a double slit)which narrows the X-rays transmitting the container down to the narrow beamsin front of the detectorand disposing a focal spotof the X-ray generating source, a center of the slit, and a center of the detectoron a same straight line. The X-ray beamsare irradiated substantially parallel to a tangential direction of a container peripheral wall, and the X-rays transmitting the container peripheral wall are detected by the detector; thereby a thickness of each layer or the space between layers of the container peripheral wall is measured based on an obtained intensity distribution curve of damping on transmission.