The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2005

Filed:

Nov. 30, 2003
Applicants:

Norman F. Sheppard, Jr., Bedford, MA (US);

Alec Mian, Cambridge, MA (US);

Gregory Kellogg, Somerville, MA (US);

Stephen G. Kieffer-higgins, Dorchester, MA (US);

Bruce L. Carvalho, Watertown, MA (US);

Inventors:

Norman F. Sheppard, Jr., Bedford, MA (US);

Alec Mian, Cambridge, MA (US);

Gregory Kellogg, Somerville, MA (US);

Stephen G. Kieffer-Higgins, Dorchester, MA (US);

Bruce L. Carvalho, Watertown, MA (US);

Assignee:

Tecan Trading AG, Baar, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N021/00 ;
U.S. Cl.
CPC ...
Abstract

This invention provides methods and apparatus for detecting and quantifying particulate matter suspended in a fluid. Specifically, the invention provides an integrated, affinity-binding based, analytical system comprising a platform for performing an affinity-binding based assay for specifically binding particulates including microbial cells, and a detection means for detecting the particulates specifically bound to a defined surface or chamber comprising the platform. Methods for using the analytical systems of the invention are also provided.


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