The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2005
Filed:
Feb. 12, 2001
Stephan W. Wegerich, Glendale Heights, IL (US);
Alan D. Wilks, Mount Prospect, IL (US);
John D. Nelligan, Mount Prospect, IL (US);
Stephan W. Wegerich, Glendale Heights, IL (US);
Alan D. Wilks, Mount Prospect, IL (US);
John D. Nelligan, Mount Prospect, IL (US);
SmartSignal Corporation, Lisle, IL (US);
Abstract
A system for detecting subtle differences in a signal in a set of linearly and/or non-linearly related signals that characterize a sensor-instrumented machine, process or living system. The system employs an improved similarity operator for signal differentiation. Signals or data representative of several linearly and/or non-linearly related parameters that describe a machine, process or living system are input to the inventive system, which compares the input to acceptable modeled states. If one or more of the input signals or data are different than expected, given the relationships between the parameters, the inventive system will indicate that difference. The system can provide expected parameter values, as well as the differences between expected and input signals; or the system can provide raw measures of similarity between the collection of input signals and the collection of acceptable modeled states. The system can be embodied in software or in a micro-controller.