The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2005
Filed:
Jul. 02, 2002
Hugh P. Mcadams, McKinney, TX (US);
James W. Grace, Los Altos Hills, CA (US);
Ralph H. Lanham, Cupertino, CA (US);
Hugh P. McAdams, McKinney, TX (US);
James W. Grace, Los Altos Hills, CA (US);
Ralph H. Lanham, Cupertino, CA (US);
Texas Instruments, Inc., Dallas, TX (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An integrated circuit (IC) chip contains a small non-volatile 'ID' memory such as an FeRAM array that stores information associated with manufacturing, testing, and performance of the IC chip. The stored information can include but is not limited to a serial number, a wafer ID, a batch ID, a date code, chip history, test data, and performance information. The storing information on the chip eliminates any difficulty in matching the information with the IC chip and provides a flexible permanent record of any information the manufacturer may find useful. The ID memory thus permits tracking and identification of ICs to a degree that was not previously practical. Additionally, a self-test can compare prior test results stored in the ID memory to current self-test results to detect defects or to select operating parameters of the integrated circuit.