The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2005
Filed:
Sep. 23, 2003
David C. Chu, Palo Alto, CA (US);
Carol Joann Courville, San Jose, CA (US);
Lee C. Kalem, Los Gatos, CA (US);
David C. Chu, Palo Alto, CA (US);
Carol Joann Courville, San Jose, CA (US);
Lee C. Kalem, Los Gatos, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method of digitizing first and second signals in imperfect quadrature for obtaining characteristic parameters of the first signal comprises providing a first signal, the first signal comprising an inphase quasi-sinusoidal analog signal. The method comprises providing a second signal, the second signal comprising a quadrature signal. The method comprises digitizing the first signal at a sampling rate, thereby generating a first plurality of sets of digital signal waveform samples and digitizing the second signal at the sampling rate, thereby generating a second plurality of sets of digital signal waveform samples. The method comprises digitally processing successive first and second sets of digital signal waveform samples to generate continually updated digital characteristic parameters representing a characteristic behavior of the first signal.