The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2005
Filed:
Oct. 22, 2003
Oliver Schreck, Bamberg, DE;
Mike Müller, Möhrendorf, DE;
Martin Harder, Nürnberg, DE;
Hans-peter Hollenbach, Eggolsheim, DE;
Franz Schmitt, Somerville, MA (US);
Ines Nimsky, Erlangen, DE;
Anders Dale, Boston, MA (US);
Andre Van Der Kouwe, Woburn, MA (US);
Oliver Schreck, Bamberg, DE;
Mike Müller, Möhrendorf, DE;
Martin Harder, Nürnberg, DE;
Hans-Peter Hollenbach, Eggolsheim, DE;
Franz Schmitt, Somerville, MA (US);
Ines Nimsky, Erlangen, DE;
Anders Dale, Boston, MA (US);
Andre Van Der Kouwe, Woburn, MA (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method and computer program product for operating a tomographic imaging apparatus, a standard measurement protocol is generated by displaying a planning representation of a standard object, defining a spatial position of a standard imaging area in the planning representation, and storing, as the standard measurement protocol for the standard object, a reference to the standard object and parameters of the standard imaging area. Such a standard measurement protocol can then be used in the slice position planning for an actual tomographic measurement, by obtaining data representing features of an examination object, corresponding to the standard object, determining a geometrical relation of the features of the examination object to features of the standard object, and generating an object-specific measurement protocol wherein the imaging area is positioned relative to the examination object by modification of the standard measurement protocol.