The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Nov. 16, 2001
Tiangong Liu, Mountain View, CA (US);
Jinghui LI, San Jose, CA (US);
Tongqing Wang, Los Altos, CA (US);
Tiangong Liu, Mountain View, CA (US);
Jinghui Li, San Jose, CA (US);
Tongqing Wang, Los Altos, CA (US);
Oplink Communications, Inc., Fremont, CA (US);
Abstract
A multi-purpose bit error rate tester (MPBERT) and a method of bit error rate (BER) testing of electrical and optical components and subsystems of electrical and optical communications systems is provided. The invention provides for bit error rate testing both in the optical and the electrical domain, and for bit error rate testing at higher than achievable rates in the electrical domain by multiplexing and demultiplexing in the optical domain. An MPBERT constructed according to the invention incorporates at least one optical multiplexer, and advantageously incorporates at least one optical demultiplexer, and in some embodiments uses high data rate optical RZ to NRZ conversion and high data rate optical NRZ to RZ conversion.