The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Jun. 09, 2003
Applicants:
Rudolph J. Gomez, Fremont, CA (US);
Peter M. Piet, Orinda, CA (US);
Kip M. Farmer, Mountain View, CA (US);
Inventors:
Rudolph J. Gomez, Fremont, CA (US);
Peter M. Piet, Orinda, CA (US);
Kip M. Farmer, Mountain View, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F011/30 ;
U.S. Cl.
CPC ...
Abstract
A method and system of calculating device metric is disclosed. In accordance with one embodiment, life-cycle data for devices are acquired; then, the devices are qualified based on the completeness and consistency of the data for calculating the metric. The metric is then calculated using the qualified devices data.
Gomez, Rudolph. (2005). Method of calculating device metrics (U.S. Patent No. 6950781). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6950781
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