The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2005

Filed:

Dec. 31, 2003
Applicant:

Kartik Ramanujachar, Sugarland, TX (US);

Inventor:

Kartik Ramanujachar, Sugarland, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F001/00 ; G01F007/00 ; G06F019/00 ;
U.S. Cl.
CPC ...
Abstract

In one embodiment, a method for wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object includes receiving an acoustic signal from an acoustic scan of an object and calculating a wavelet power spectrum of the acoustic signal. The method also includes accessing a library of one or more reference wavelet power spectra that each correspond to one or more objects that comprise one or more known anomalies and comparing the wavelet power spectrum with one or more reference wavelet power spectra. If the wavelet power spectrum from the acoustic scan corresponds to one or more reference wavelet power spectra, analysis results are communicated indicating that the object under analysis comprises one or more particular known anomalies corresponding to the one or more reference wavelet power spectra that correspond to the wavelet power spectrum. If the wavelet power spectrum does not correspond to one or more reference wavelet power spectra, analysis results are communicated indicating that the object under analysis lacks the one or more known anomalies that the one or more reference wavelet power spectra in the library correspond to.


Find Patent Forward Citations

Ramanujachar, Kartik. (2005). Wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object (U.S. Patent No. 6950761). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6950761

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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