The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Mar. 16, 2001
Ivan A. Bachelder, Newton, MA (US);
Yun Chang, Lexington, MA (US);
Yasunari Tosa, Lexington, MA (US);
Venkat Gopalakrishnan, Framingham, MA (US);
Raymond Fix, Natick, MA (US);
Rob Milligan, Maynard, MA (US);
Therese Hunt, Framingham, MA (US);
Karen Roberts, Natick, MA (US);
Ivan A. Bachelder, Newton, MA (US);
Yun Chang, Lexington, MA (US);
Yasunari Tosa, Lexington, MA (US);
Venkat Gopalakrishnan, Framingham, MA (US);
Raymond Fix, Natick, MA (US);
Rob Milligan, Maynard, MA (US);
Therese Hunt, Framingham, MA (US);
Karen Roberts, Natick, MA (US);
Cognex Corporation, Natick, MA (US);
Abstract
A method and system create a geometric object model for use in machine vision inspection. A pixel image representation of an object is acquired. Based on this pixel image representation, part models for the parts of the object are generated. Each part model corresponds to a different part of the object. From the part models of the object, a model for the entire object can be created. Using this created object model, a test inspection is performed on a set of test images, and each of the test images is associated with a set of known inspection measurements. The test inspection produces a set of testing inspection measurements. If the test inspection yields satisfactory performance, the object models created are stored.