The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Feb. 10, 1999
Norio Chiba, Chiba, JP;
Yasuyuki Mitsuoka, Chiba, JP;
Nobuyuki Kasama, Chiba, JP;
Takashi Niwa, Chiba, JP;
Kunio Nakajima, Chiba, JP;
Norio Chiba, Chiba, JP;
Yasuyuki Mitsuoka, Chiba, JP;
Nobuyuki Kasama, Chiba, JP;
Takashi Niwa, Chiba, JP;
Kunio Nakajima, Chiba, JP;
Seiko Instruments Inc., Chiba, JP;
Abstract
In an information recording apparatus for recording information onto a recording medium by utilizing a technology in a near-field microscope, the information recording apparatus carries out recording with reliability and density. An optical probe () or micro-cantilever () utilized in a near-field microscope is used as a recording probe (). The recording probe () at its tip is heated by laser light () illumination or heating by an electric heating element to radiate microscopic-region thermal energy through the tip to a recording medium (). This makes it possible to record microscopically information onto the recording medium () that varies in physical properties due to heating. Furthermore, thermal energy is provided to a recording position through an auxiliary heat radiating means thereby enabling recording more positively.