The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Jan. 31, 2003
Guoqiao Tao, Nijmegen, NL;
Guoqiao Tao, Nijmegen, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a non-volatile memory test structure, comprising a plurality of memory cells arranged in rows and columns, each memory cell comprising at least a memory transistor and having a source terminal, a gate terminal and a drain terminal. In order to provide a fast and effective test structure to be used for fast reliability evaluation in monitoring of non-volatile memory elements on every wafer it is proposed according to the present invention that:—a group of said memory cells is connected in parallel,—the source terminals of the memory cells in the group are connected together and to a source line,—the drain terminals of the memory cells in the group are connected together and to a drain line,—the gate terminals of the memory cells in the group are connected together and to a gate line, and—said gate line has two connections to apply an electrical current to said gate line for using it as a heating means.