The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2005

Filed:

Aug. 08, 2000
Applicants:

Edouard Da Silva, Lille, FR;

Michel Delhaye, Villeneuve d'Ascq, FR;

Michel Leclercq, Bois le Roi, FR;

Bernard Roussel, Valenciennes, FR;

Inventors:

Edouard Da Silva, Lille, FR;

Michel DelHaye, Villeneuve d'Ascq, FR;

Michel Leclercq, Bois le Roi, FR;

Bernard Roussel, Valenciennes, FR;

Assignee:

Jobin Yvon S.A., Longjumeau, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J003/28 ;
U.S. Cl.
CPC ...
Abstract

An inelastic diffusion spectrometric imaging apparatus includes an illuminating and energising system including a confocal first aperture and a second confocal aperture combined with the first. A first deflector assembly scanning for scanning a sample and a second deflector assembly sychronised with the first, are placed respectively downstream and upstream of the second confocal aperture and a spectrometer. The input aperture of the spectrometer merges with the second confocal aperture.


Find Patent Forward Citations

Loading…