The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Jul. 31, 2001
Kazuhisa Yoshiwara, Kodaira, JP;
Hideo Onodera, Higashiyamato, JP;
Kazuhisa Yoshiwara, Kodaira, JP;
Hideo Onodera, Higashiyamato, JP;
Hitachi Kokusai Electric Inc., Tokyo, JP;
Abstract
A defective pixel detecting method and an image-pickup apparatus having a plurality of solid-state image-pickup devices each receiving respective one of spectral lights obtained by separating light incident to the image-pickup apparatus, generating, for each spectral light, a value relating to an inspected defective pixel on an associated solid-state image-pickup device located at a corresponding same image-pickup point among the plurality of solid-state image-pickup devices based on a signal level produced from the inspected pixel and signal levels produced from a plurality of pixels of the associated solid-state image-pickup device in the vicinity of the inspected pixel, and determining the solid-state image-pickup device that generated a defective pixel based on the values obtained with respect to the plurality of solid-state image-pickup devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile