The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Jul. 20, 2004
Applicants:
Pei-wen Luo, Kaohsiung, TW;
Yeong-jar Chang, Taichung, TW;
Jung-chi Ho, Taipei, TW;
Wen-ching Wu, Hsinchu, TW;
Inventors:
Pei-Wen Luo, Kaohsiung, TW;
Yeong-Jar Chang, Taichung, TW;
Jung-Chi Ho, Taipei, TW;
Wen-Ching Wu, Hsinchu, TW;
Assignee:
Industrial Technology Research Institute, Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M001/10 ;
U.S. Cl.
CPC ...
Abstract
IC with built-in self-test and design method thereof. The IC comprises an SD-ADC and a Dft circuit. The Dft circuit uses a digital stimulus signal to solve the deadlock problem of the on-chip analog testing and avoid thermal noise. Moreover, according to the design method of the IC, circuits having different specification can use the Dft circuit without performance degradation for original SD-ADC.