The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2005

Filed:

Nov. 01, 2002
Applicants:

Joseph D. Stenger, North Plains, OR (US);

Brent R. Jensen, Portland, OR (US);

Inventors:

Joseph D. Stenger, North Plains, OR (US);

Brent R. Jensen, Portland, OR (US);

Assignee:

Cypress Semiconductor Corp., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/12 ; G01R031/02 ;
U.S. Cl.
CPC ...
Abstract

A system and method of testing switch functionality of a tunable capacitor array is disclosed. A built in test (BIT) circuit provides digital device for testing the functionality of a programmable switch capacitor array circuit. The method and system provides for switching a capacitor switch of a switch capacitor array between on and off, switching a test enable switch of a BIT circuit between on and off, pulling an internal node of the BIT circuit either high or low using a current source, and determining whether the internal node has been pulled either high or low. In addition, the method and system provides for making a pass or fail determination based on a determined state of the internal node.


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