The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2005
Filed:
Apr. 22, 2003
Benjamin R. Neff, Fort Wayne, IN (US);
Jeff D. Pruitt, Fort Wayne, IN (US);
Matthew L. Gypson, Fort Wayne, IN (US);
Michael E. Dobbs, Fort Wayne, IN (US);
Benjamin R. Neff, Fort Wayne, IN (US);
Jeff D. Pruitt, Fort Wayne, IN (US);
Matthew L. Gypson, Fort Wayne, IN (US);
Michael E. Dobbs, Fort Wayne, IN (US);
ITT Manufacturing Enterprises, Inc., Wilmington, DE (US);
Abstract
A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A science detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.