The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Nov. 13, 2002
Clarke Daniel Bowers, Baltimore, MD (US);
Clarke Daniel Bowers, Baltimore, MD (US);
Prometric, Wilmington, DE (US);
Abstract
A system for computer-based testing for producing a test and delivering the test to an examinee includes a storage device that has a first storage location, which stores a first segment of a test definition language, and a second storage location, which stores a second segment of the test definition language, a validation expansion module that validates the first segment and the second segment of the test definition language, a test packager that amalgamates the first storage location and the second storage location and transmits the amalgamated segment to the validation expansion module such that the validation expansion module can determine whether the amalgamated segment forms a complete and valid set, and a test driver that has an executable code that controls functionality that enables the test driver to deliver the test to an examinee. A method of computer-based testing includes validating a first segment of the test definition language, amalgamating the first segment and the second segment of the test definition language, validating an amalgamated segment, such that the amalgamated segment is valid if the amalgamated segment forms a complete and valid set, and amalgamating the first segment and the second segment of the test definition language during a test delivery cycle.