The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Aug. 27, 2001
Takashi Ohgawara, Yokohama, JP;
Koji Yamamoto, Kawasaki, JP;
Eitarou Tambo, Fujisawa, JP;
Masayuki Torimitsu, Tokyo, JP;
Takashi Ohgawara, Yokohama, JP;
Koji Yamamoto, Kawasaki, JP;
Eitarou Tambo, Fujisawa, JP;
Masayuki Torimitsu, Tokyo, JP;
Toshiba Engineering Corporation, Kanagawa-ken, JP;
Mitsui Bussan Plant & Project Corporation, Tokyo, JP;
Abstract
In a system for observing the ground based on various data items measured at one or more observation points by at least one measuring instrument, the measured data items are collected in a collection center, it is determined whether at least one of the measured data items is abnormal based on expert knowledge, a re-measurement instruction is given to the measuring instrument in a case where at least one of the measured data items is abnormal, and the measured data items are edited according to contract conditions for each user to generate measurement data for users in a case where it is determines that the measuring instrument does not malfunction as a result of re-measurement. Thus, the measurement data satisfying users' demands can be generated with good quality and high reliability, based on the measurement data items obtained at one or more observation points.