The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Sep. 30, 2003
Youping Deng, Sunnyvale, CA (US);
Christopher D. Keener, San Jose, CA (US);
Jinsong Wang, San Jose, CA (US);
Youping Deng, Sunnyvale, CA (US);
Christopher D. Keener, San Jose, CA (US);
Jinsong Wang, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands, B.V., Amsterdam, NL;
Abstract
A method for improving yields in manufacturing processes includes identifying parameters which affect performance at a subsequent step in the process, collecting data concerning individual performance parameters, creating a reference scale which correlates individual parameters with probability of failure at a subsequent step in the process, testing a manufactured unit to collect performance data concerning two or more of the individual parameters from a manufactured unit, comparing performance data concerning two or more of the individual parameters from the manufactured unit to the reference scale to assign probability of failure for each of the single performance parameters, calculating a Figure of Merit, and utilizing the Figure of Merit to sort or disposition units.