The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2005

Filed:

Mar. 31, 2003
Applicants:

Tate S. Picard, Enfield, NH (US);

Kenneth J. Woods, Lebanon, NH (US);

Roger E. Young, Jr., Canaan, NH (US);

William J. Connally, Grantham, NH (US);

Inventors:

Tate S. Picard, Enfield, NH (US);

Kenneth J. Woods, Lebanon, NH (US);

Roger E. Young, Jr., Canaan, NH (US);

William J. Connally, Grantham, NH (US);

Assignee:

Hypertherm, Inc., Hanover, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F019/00 ;
U.S. Cl.
CPC ...
Abstract

Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector for measuring a signal emitted from the workpiece as a result of the incident laser beam. The detector generates at least two signals based upon the optical signal. The method also involves use of a light source monitor in determining workpiece processing quality based upon the quotient of the two outputs as well as a magnitude of one of the two quotients.


Find Patent Forward Citations

Loading…