The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Jul. 24, 2002
Jason Arthur Dean, Erie, PA (US);
Nicholas Edward Roddy, Clifton Park, NY (US);
Jason Arthur Dean, Erie, PA (US);
Nicholas Edward Roddy, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system () and method () for diagnosing a malfunctioning machine. A fault event is selected () together with sequential operating parameter data () from a selectively focused time interval about the fault event for evaluation of a machine (). The selectively focused time interval may include data occurring just before, just after, or spanning the fault event. Characterizing information such as slope, rate of change, and absolute sign of the data may be derived () from the operating parameter data over the selectively focused time interval and used in the diagnosis. The fault event and operating parameter data may be compared to existing cases in a case database (). A set of rules () or candidate anomalies () may be executed over the operating parameter data to further improve the accuracy of the diagnosis.