The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2005

Filed:

Mar. 26, 2001
Applicant:

Maurice Givens, Chicago, IL (US);

Inventor:

Maurice Givens, Chicago, IL (US);

Assignee:

Tellabs Operations, Inc., Naperville, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M001/00 ;
U.S. Cl.
CPC ...
Abstract

An apparatus and method for estimating a time delay between two signals are provided. An original signal and a delayed signal are provided to an average magnitude difference processor for determining an average magnitude difference for a sum of samples representing an envelope of each of the respective original and delayed signals, each for a series of sample delays. The time delay between the two signals is determined as the sample delay which minimizes the average magnitude difference.


Find Patent Forward Citations

Givens, Maurice. (2005). Apparatus and method of time delay estimation (U.S. Patent No. 6947551). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6947551

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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