The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Jun. 17, 2003
Miles N. Wernick, Chicago, IL (US);
Leroy Dean Chapman, Bolingbrook, IL (US);
Oral Oltulu, Chicago, IL (US);
Zhong Zhong, Stony Brook, NY (US);
Miles N. Wernick, Chicago, IL (US);
Leroy Dean Chapman, Bolingbrook, IL (US);
Oral Oltulu, Chicago, IL (US);
Zhong Zhong, Stony Brook, NY (US);
Illinois Institute of Technology, Chicago, IL (US);
Abstract
A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object.