The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2005

Filed:

Feb. 16, 2001
Applicants:

Eiji Yokoyama, Tokyo, JP;

Tomoaki Ryu, Tokyo, JP;

Inventors:

Eiji Yokoyama, Tokyo, JP;

Tomoaki Ryu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B007/00 ;
U.S. Cl.
CPC ...
Abstract

A disk physical strain correction signal generator outputs a signal obtained by allowing a phase compensation signal to pass a LPF as a disk physical strain correction signal during a normal period. During a defect detection period, it outputs the output signal of the LPF sampled at the time of the defect detection start as the disk physical strain correction signal. A disturbance pulse correction signal is output based upon a disturbance pulse obtained by subtracting the disk physical strain correction signal from the phase compensation signal. The disk physical strain correction signal and the disturbance pulse correction signal are added to output a defect compensation signal. This defect compensation signal is applied as an actuator control signal during the defect detection period. Thus, it is possible to provide an optical disk device which can carry out a stable driving control for a reproducing operation, etc. without losing the continuity of control before and after the defect detection even when the defect detection period is long.


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