The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Nov. 02, 2001
Teckkhoon Lim, Singapore, SG;
Myint Ngwe, Singapore, SG;
Kokhoe Chia, Singapore, SG;
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
Method and apparatus for detecting defects in a magnetic medium of a data handling system. The magnetic medium includes a number of user data wedges each disposed between an adjacent pair of servo data wedges. A predetermined data sequence is written to the user data wedges, and subsequently read to generate a readback signal. A sequence of discrete time sample values are generated from the readback signal. Defects in the medium are detected in relation to the magnitudes of the discrete time samples. A media scan controller outputs a first multi-bit information record having at least one bit composing the address of the user data wedge containing a defect, and a second multi-bit information record having at least one bit composing an address of the defect within the user data wedge. No information is written to the buffer when no defects are identified.