The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Jan. 12, 1999
Geoffrey M. Wahl, San Diego, CA (US);
Noriaki Shimizu, Hiroshima, JP;
Teru Kanda, La Jolla, CA (US);
H. Michael Shepard, Rancho Santa Fe, CA (US);
Geoffrey M. Wahl, San Diego, CA (US);
Noriaki Shimizu, Hiroshima, JP;
Teru Kanda, La Jolla, CA (US);
H. Michael Shepard, Rancho Santa Fe, CA (US);
The Salk Institute For Biological Studies, La Jolla, CA (US);
Abstract
This invention provides methods by which test substances can be screened for their ability to inhibit, enhance or eliminate double minute (DM) or extrachromosomal DNA by micronucleation in cells. This invention also provides a method for inducing maturation or death of a cell having the capacity to generate micronuclei. It also provides a method of treating a disease in a subject, the cells correlated with the disease having DM and extrachromosomal DNA as well as the capacity to generate micronuclei to capture them. Further provided is a method of detecting chromosomal and extrachromosomal DNA in a cell.